High-End fluorescence system at Fraunhofer IMWS/AWZ - Soest, Germany
Research and development of highly efficient LED and luminescent materials.
Dual microscope system
at the Department of Physics of the University - Leipzig, Germany.
MonoVista CRS+ system with parallel fiber-coupled customer specific photoluminescence monochromator.
Simultaneous measurement of Raman (inverted) and Photoluminescence (upright) spectra in one take, for determining characteristics of solid-state materials
External Cryostat coupling arm
for MonoVista CRS+ (inverted microscope) - Warsaw, Poland
Determination of Raman signal change and characteristics of low-temperature samples.
High Precision fiber-coupled measurement head
to external AFM – Madrid, Spain
MonoVista CRS+ with external coupling to CSInstruments Nano-Observer AFM system
Comparison of Raman signal and AFM measurement on thin-film samples.
Vibration isolated MonoVista CRS+
with Nanonics AFM system - Salzburg, Austria
Characterization of thin-film samples by comparison of AFM and resulting Raman signals.
Oversized microscope stage (200x200mm)
on Olympus BW51WI microscope - Oslo, Norway
MonoVista CRS+ with larger than usual microscope stage, for silicon wafer fast-mapping measurements. Determination of silicon lattice stress, through Raman peak-shift.
External customer specific laser delay line
- Lund, Sweden
Timed measurements on MonoVsita CRS+ system with internal Raman and external pulse laser sources.