Extension XYZ Stage Control
Mapping/AFM
- Support for Märzhäuser motorized XYZ stages, as well as Physik Instrumente piezo controllers
- Raman/PL XYZ mapping (2D und 3D) software with/without autofocus function
- Fast mapping capability for suitable Raman/PL CCD detectors
- Image mapping (additional microscope imaging required)
- Image stitching (additional microscope imaging required)
- Mapping postprocessing and analysis functions like peak-shift, integral and multi-variant
AFM
If using an AFM (Atomic Force Microscope) from Nanonics, JPK or CSI it can be controlled within VistaControl to get AFM – Raman combined data. So it’s possible to get the topography from the AFM and simultaneously the Raman image from S&I’s CRS system. The acquired data can be viewed in different ways:
